Electronic systems with large stretchability have many applications.A precisely controlled buckling strategy to increase the stretchability has been demonstrated by combining lithographically patterned surface bonding chemistry and a buckling process.The buckled geometry was assumed to have a sinusoidal form,which may result in errors to determine the strains in the film.A theoretical model is presented in this letter to study the mechanics of this type of thin film/substrate system by discarding the assumption of sinusoidal buckling geometry.It is shown that the previous model overestimates the deflection and curvature in the thin film.The results from the model agree well with finite element simulations and therefore provide design guidelines in many applications ranging from stretchable electronics to micro/nano scale surface patterning and precision metrology.
Over exposure is rather annoying in photo taking. However, in some severe light conditions over exposure is inevitable using conventional cameras due to the limitation of dynamic range of the image sensor. The over exposed information would be completely lost and unrecoverable. In order to cope with this problem, we propose a novel technique in which the noise is used to enlarge the dynamic range of the image sensor. The essential mechanism that noise contributes to the information recovery is investigated. It is also proved that the visibility of regained information can reach the peak when specifically added noise is synchronized with the image sensor, thus activating the phenomenon of stochastic resonance （SR）. Four different types of noises are investigated to show the effects of variant distributions on the quality of recovered information. The experimental outcomes are consistent with our theoretical results, which indicates that the SR-based lost information recovery is quite promising.
