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国家自然科学基金(61306084)

作品数:8 被引量:11H指数:2
相关作者:龚洪勇周浪黄海宾高江汪已琳更多>>
相关机构:南昌大学新余学院华东交通大学更多>>
发文基金:国家自然科学基金国家教育部博士点基金江西省自然科学基金更多>>
相关领域:动力工程及工程热物理电气工程电子电信理学更多>>

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8 条 记 录,以下是 1-8
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Enhanced near-infrared responsivity of silicon photodetector by the impurity photovoltaic effect
2015年
The near-infrared responsivity of a silicon photodetector employing the impurity photovoltaic (IPV) effect is investigated with a numerical method. The improvement of the responsivity can reach 0.358 A/W at a wavelength of about 1200 nm, and its corresponding quantum efficiency is 41.1%. The origin of the enhanced responsivity is attributed to the absorption of sub-bandgap photons, which results in the carrier transition from the impurity energy level to the conduction band. The results indicate that the IPV effect may provide a general approach to enhancing the responsivity of photodetectors.
袁吉仁黄海宾邓新华梁晓军周耐根周浪
关键词:RESPONSIVITYPHOTODETECTOR
Photoemission cross section:A critical parameter in the impurity photovoltaic effect
2017年
A numerical study has been conducted to explore the role of photoemission cross sections in the impurity photovoltaic(IPV) effect for silicon solar cells doped with indium. The photovoltaic parameters(short-circuit current density, opencircuit voltage, and conversion efficiency) of the IPV solar cell were calculated as functions of variable electron and hole photoemission cross sections. The presented results show that the electron and hole photoemission cross sections play critical roles in the IPV effect. When the electron photoemission cross section is 10^-20cm^2, the conversion efficiencyη of the IPV cell always has a negative gain(△η 0) if the IPV impurity is introduced. A large hole photoemission cross section can adversely impact IPV solar cell performance. The combination of a small hole photoemission cross section and a large electron photoemission cross section can achieve higher conversion efficiency for the IPV solar cell since a large electron photoemission cross section can enhance the necessary electron transition from the impurity level to the conduction band and a small hole photoemission cross section can reduce the needless sub-bandgap absorption. It is concluded that those impurities with small(large) hole photoemission cross section and large(small) electron photoemission cross section,whose energy levels are near the valence(or conduction) band edge, may be suitable for use in IPV solar cells. These results may help in judging whether or not an impurity is appropriate for use in IPV solar cells according to its electron and hole photoemission cross sections.
Jiren YuanHaibin HuangXinhua DengZhihao YueYuping HeNaigen ZhouLang Zhou
Properties of Boron-doped μc-Ge:H Films Deposited by Hot-wire CVD
2015年
Boron-doped hydrogenated microcrystalline Germanium (lac-Ge:H) films were deposited by hot-wire CVD. H2 diluted G-ell4 and B2H6 were used as precursors and the substrate temperature was kept at 300 ℃. The properties of the samples were analyzed by XRD, Raman spectroscopy, Fourier transform infrared spectrometer and Hall Effect measurement with Van der Pauw method. It is found that the films are partially crystallized, with crystalline fractions larger than 45% and grain sizes smaller than 50 nm. The B-doping can enhance the crystallization but reduce the grain sizes, and also enhance the preferential growth of Ge (220). The conductivity of the films increases and tends to be saturated with increasing diborane-to-germane ratio RB2H6. All the Hall mobilities of the samples are larger than 3.8 cmZV-1·s-1. A high conductivity of
黄海宾沈鸿烈WU TianruLU LinfengTANG ZhengxiaSHEN Jiancang
关键词:HWCVD
低速率沉积非晶硅薄膜钝化Cz-Si片的研究被引量:1
2015年
采用PECVD法在低沉积速率(<1?/s)条件下制备非晶硅,双面钝化n型Cz硅片(40 mm×40 mm),钝化最好的硅片平均少子寿命值为889μs,局部最高近1600μs,用准稳态光电导法测试的平均伪开路电压i Voc达722 m V。对FTIR测试结果分析表明:非晶硅薄膜中的Si H2与Si H键的相对数量对钝化效果具有重要影响。
龚洪勇黄海宾高江周浪
关键词:氢化非晶硅PECVD钝化
轴向磁场下多晶硅定向凝固研究被引量:1
2018年
利用有限元软件COMSOL Multiphysics对多晶硅定向凝固过程进行二维数值模拟,研究轴向磁场对多晶硅定向凝固的影响。模拟结果显示,未加磁场时多晶硅固液界面的等温线是下凹的;当线圈中加以不同的电流进行磁场模拟时,发现轴向磁场能够有效地抑制硅熔体对流,进而影响结晶时的固液界面。随着电流的增大,熔体最大流速减小,最大洛伦兹力也增大。通过试验验证,相同的工艺条件,在磁场作用下相比于没有磁场时硅锭的界面由下凹变得平滑。
刘志辉罗玉峰饶森林胡云张发云张发云刘杰
关键词:多晶硅定向凝固数值模拟轴向磁场
β-FeSi_2 as the bottom absorber of triple-junction thin-film solar cells: A numerical study
2014年
Using β-FeSi2 as the bottom absorber of triple-junction thin-film solar cells is investigated by a numerical method for widening the long-wave spectral response. The presented results show that the β-FeSi2 subcell can contribute 0.273 V of open-circuit voltage to the a-Si/μc-Si/β-FeSi2 triple-junction thin-film solar cell. The optimized absorber thicknesses for a- Si, μ-Si, and/3-FeSi2 subcells are 260 nm, 900 nm, and 40 nm, respectively. In addition, the temperature coefficient of the conversion efficiency of the a-Si/μc-Si//3-FeSi2 cell is -0.308 %/K, whose absolute value is only greater than that of the a-Si subcell. This result indicates that the a-Si/μc-Si/β-FeSi2 triple-junction solar cell has a good temperature coefficient. As a result, using β-FeSi2 as the bottom absorber can improve the thin-film solar cell performance, and the a-Si/μc-Si/β-FeSi2 triple-junction solar cell is a promising structure configuration for improving the solar cell efficiency.
袁吉仁沈鸿烈周浪黄海宾周耐根邓新华余启名
关键词:Β-FESI2
α-SiO_x∶H钝化Cz-Si表面的工艺优化与机制分析被引量:4
2014年
氢化非晶氧化硅(α-SiOx∶H)是一种优质的硅片表面钝化材料。采用PECVD法,以SiH4、CO2和H2作为气源制备α-SiOx∶H薄膜钝化Cz-Si表面,研究了沉积气压和CO2∶SiH4流量比对钝化效果的影响规律及作用机制。采用准稳态光电导法测试了硅片的有效少子寿命并依此计算出其表面复合速率以对薄膜的钝化效果进行定量表征,采用光谱型椭偏仪测试了样品的介电常数虚部ε2谱对样品微观结构进行了定性分析。结果表明,(1)在所研究范围内,氧掺入非晶硅薄膜使得薄膜结构趋向非晶化,沉积气压主要对薄膜中的空位浓度造成影响,而CO2/SiH4流量比的增加可增加薄膜中的H含量并改变了硅氢键的结构,从而影响薄膜的钝化效果;(2)在CO2/SiH4流量比为3.0/3.0mL/min,沉积气压为22Pa条件下获得了最优钝化效果,钝化后硅片有效少子寿命为975μs,表面复合速率为3.9cm/s。
黄海宾张东华汪已琳龚洪勇高江Wolfgang R.Fahrner周浪
关键词:PECVD氢含量
晶体硅金字塔绒面结构圆化对其光反射率和非晶硅薄膜钝化效果的影响被引量:6
2015年
(001)晶体硅金字塔绒面结构圆化有提高光反射率与提高非晶硅薄膜钝化效果的相互矛盾的双重作用,定量了解它们对优化非晶硅/晶体硅异质结太阳电池的绒面结构圆化程度很有必要。本文以表面粗糙度Rz相对下降百分数定量表征晶体硅衬底表面金字塔绒面结构圆化程度DR,研究了DR值对等离子体化学气相沉积氢化本征非晶硅薄膜钝化效果的改善作用,发现除圆化初期效果异常高以外,二者之间基本呈线性正比关系;相对改善作用随钝化膜变薄而显著提高。同时测定了DR值对金字塔绒面光反射率的影响,发现反射率基本随DR值线性增大。典型结果为:6%绒面结构圆化程度下,金字塔绒面的光反射率绝对值提高3%;其表面7 nm厚的氢化本征非晶硅薄膜可达到使硅片少数载流子寿命相对未圆化绒面样品提高260%。
龚洪勇黄海宾周浪
关键词:晶体硅绒面非晶硅钝化
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